






Vol.4 , No. 3, Publication Date: Aug. 8, 2017, Page: 12-18
[1] | Arun Patade, DCMP&MS, Tata Institute of Fundamental Research, Colaba, Mumbai, India. |
[2] | Kadayam Venkatraman Srinivasan, Low Temperature Facility, Tata Institute of Fundamental Research, Colaba, Mumbai, India. |
[3] | Devendra Buddhikot, DCMP&MS, Tata Institute of Fundamental Research, Colaba, Mumbai, India. |
[4] | Anindya Chakravarty, Cryo-Technology Division, BARC, Mumbai, India. |
[5] | Vijay Arolkar, Low Temperature Facility, Tata Institute of Fundamental Research, Colaba, Mumbai, India. |
Cryogenic temperature sensors of various types covering the entire range of measurement right from the room temperature down to 4.2 K needs to be calibrated to meet the stringent requirements on temperature control in most cryogenic applications. For some critical applications in BARC, Mumbai such as the newly developed Helium Liquefaction/Refrigeration system, many temperature sensors were calibrated using a magnetoresistance setup designed and developed at TIFR, Mumbai. The sensors are calibrated against a pre-calibrated temperature sensor. Both the pre-calibrated sensor and the sensor to be calibrated are connected to the temperature controller and the calibration data are acquired by varying temperature at small intervals from 4.2 K to 300 K. The data acquisition program is written in LabView®. This paper presents the calibration set-up, procedure, the quality assurance applied, the results of the calibration campaigns and a description of the usage of the calibrated temperature sensors.
Keywords
Sensors, Calibration, Variable Temperature Insert (VTI), Data Acquisition, Silicon Diode
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