






Vol.3 , No. 4, Publication Date: Aug. 12, 2016, Page: 52-56
[1] | Shavkat Sh. Abdullaev, Department of Physics, Ferghana Polytechnic Institute, Ferghana, Uzbekistan. |
[2] | Nosirjon Kh. Yuldashev, Department of Physics, Ferghana Polytechnic Institute, Ferghana, Uzbekistan. |
[3] | Khusanboy M. Sulaymonov, Department of Physics, Ferghana Polytechnic Institute, Ferghana, Uzbekistan. |
The tensoresistive properties of polycrystalline (Bi0.3Sb0.7)2Te3 films at static and cyclic deformations have been investigated. It is shown that the linear portion of the current‒voltage characteristic expands from (0; 5) V (at N=0) to (0; 12) V for the films subjected to N=5×105 deformation cycles. The temperature coefficient of resistance in the range of 293 K - Tmin changes from a=-5.6×10-3 K-1 to a=-2.5×10-4 K-1. The value Tmin, at which a=0, increases with an increase in N. Tensoresistive (Bi0.3Sb0.7)2Te3 films can successfully be used in fatigue stress accumulation sensors in the temperature range T=273-413 K for a number of cycles in the range of N=0-5 105.
Keywords
Polycrystalline Composite Film, Border of Grains, Internal Mechanical Pressures, Static Deformation Characteristic, Alternating Stress Cycles, Fatigue Damage Accumulation
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