ISSN: 2375-3870
International Journal of Modern Physics and Application  
Manuscript Information
 
 
Tensoresistive Properties of Thin Polycrystalline (Bi0.3Sb0.7)2Te3 Films at Static and Cyclic Deformations
International Journal of Modern Physics and Application
Vol.3 , No. 4, Publication Date: Aug. 12, 2016, Page: 52-56
1898 Views Since August 12, 2016, 834 Downloads Since Aug. 12, 2016
 
 
Authors
 
[1]    

Shavkat Sh. Abdullaev, Department of Physics, Ferghana Polytechnic Institute, Ferghana, Uzbekistan.

[2]    

Nosirjon Kh. Yuldashev, Department of Physics, Ferghana Polytechnic Institute, Ferghana, Uzbekistan.

[3]    

Khusanboy M. Sulaymonov, Department of Physics, Ferghana Polytechnic Institute, Ferghana, Uzbekistan.

 
Abstract
 

The tensoresistive properties of polycrystalline (Bi0.3Sb0.7)2Te3 films at static and cyclic deformations have been investigated. It is shown that the linear portion of the current‒voltage characteristic expands from (0; 5) V (at N=0) to (0; 12) V for the films subjected to N=5×105 deformation cycles. The temperature coefficient of resistance in the range of 293 K - Tmin changes from a=-5.6×10-3 K-1 to a=-2.5×10-4 K-1. The value Tmin, at which a=0, increases with an increase in N. Tensoresistive (Bi0.3Sb0.7)2Te3 films can successfully be used in fatigue stress accumulation sensors in the temperature range T=273-413 K for a number of cycles in the range of N=0-5 105.


Keywords
 

Polycrystalline Composite Film, Border of Grains, Internal Mechanical Pressures, Static Deformation Characteristic, Alternating Stress Cycles, Fatigue Damage Accumulation


Reference
 
[01]    

I. P. Buryk, S. I. Vorob’jov, L. V. Odnodvorets. Tensoresistivity properties of film materials base on Ni and Mo or Cr. Physical Surface Engineering, (2009) Vol. 7, No. 1, 2, pp.115-118. (http://dspace.nbuv.gov.ua/handle/123456789/7962).

[02]    

I. H. Kazi, P. M. Wild, T. M. Moore. Charactericterization of sputtered nichrome (80/20 wt.%) films for strain guage applications. Thin Sol. Films, (2006) Vol.515, pp. 2602-2606.

[03]    

E. A. Abdullayev, Sh.D. Sultonov, N. Kh Yuldashev. Piezoresistive Effectin Chalcogenidesof lead and bismuth. P. II. Fargona, Ferghana (2006) p.118.

[04]    

O. O. Mamatkarimov, S. Z. Zainabidinov, A. Abduraimov, R.Kh. Khamidov, U.A. Tuichiev. Dynamic strain properties of diodes with a Shottky barrier under pulsing hydrostatic pressure. Semiconductors, (2000) Vol.34, No. 1, pp. 67-69.

[05]    

Kh.M. Sulaymonov, N. Kh. Yuldashev. The deformation properties of (Bi0.3Sb0.7)2Te3 films under the influence of unilateral cyclic sign-variable pressure, The Third European Conference on Physics and Mathematics 12th September (2015), Section 3. Physics. Vienna, Austria, pp. 19-26.

[06]    

Kh. M. Sulaimonov, N. Kh. Yuldashev. Piezoresistive Effectin Polycrystalline Semiconductorsin View of Longitudinaland Transverse Surface Electronic States. Physical Surface Engineering, (2015) Vol. 13, No. 3, pp. 318-324 (pse.scpt.org.ua/rus/tom3_2015.htm).

[07]    

M. A. Karimov, A. Haydarov, N. Kh. Yuldashev. Role of borders of section of grains in current-lux characteristic of a polycrystalline film of firm solution CdSexS1-x. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques (Poverkhnost'. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya), (2006) No.5, pp.88-93(http://www.issp.ac.ru/journal/surface/).

[08]    

B. Atakulov, E. A. Abdullaev, M. M. Akhmedov, N. Kh. Yuldashev, Preparation and Study of the Composition, Structure, and Strain properties of Semiconductor Films (BixSb1–x)2Te3, Available from VINITI, No. 10985 (1986).

[09]    

Sh. D. Sultonov, N. Kh. Yuldashev. The role of internal mechanical pressures in formation of deformation characteristics polycrystalline thin films р-(Bi0,5Sb0,5)23. Physical Surface Engineering, (2009) Vol.7, No. 1, 2, pp. 123-129.

[10]    

Kh. M. Sulaymonov, N. Kh. Yuldashev. Effect of Internal Stresses on the Static Strain Characteristics of p-(Bi0.3Sb0.7)2Te3 Composite Films. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, (2016) Vol. 10, No. 4, pp. 878–882.

[11]    

Sulaymonov Kh.M., Umarov M. G., Yuldashev N. Kh. Tensosensitivity of polycrystalline porous films (BixSb1-x)2Te3. Actual problems of a modern science, Russia (2015), №4, pp. 149-150.

[12]    

Sulaymonov Kh.М. Influence of cyclic deformations on electroconductivity composit films (BixSb1-x)2Te3 depending on frequency of the alternating current. XІ The International correspondence conference «Science Development in the XXI-st century» (Kharkov, 14.03.2016г.)3 part, pp. 24-26.





 
  Join Us
 
  Join as Reviewer
 
  Join Editorial Board
 
share:
 
 
Submission
 
 
Membership